?Integrated design of probe test, reliable test, and higher accuracy
?High-precision four-axis working platform, with high stability and high efficiency considered
?Unique image processing algorithm, high scanning efficiency, and accurate positioning
?Active probe pressure adjustment technology, reliable probe mark control
?pA-level high-precision current source, fully ensuring test accuracy
?Mature light source system (450-1,570nm) covering more devices to be tested
?Multiple IV curve scanning logics to improve test efficiency
?Heating test (optional)
?Support constant parameters and IV-based calculation, covering all PD&APD applications
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